Investigation of the efficiency of processing algorithms for symmetric dual Langmuir probe (SDLS) based on the proposed quality indicator. Kosm. nauka tehnol. 2002 ;8(Supplement2):213-219.
Measuring system for direct determination of plasma parameters based on a symmetric dual Langmuir probe (SDLC). Kosm. nauka tehnol. 2002 ;8(Supplement2):207-212..